Intermittent Scan Chain Fault Diagnosis Based on Signal Probability Analysis
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Diagnosis of Multiple Hold-Time and Setup-Time Faults in Scan Chains
IEEE Transactions on Computers
Quick Scan Chain Diagnosis Using Signal Profiling
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Using fault model relaxation to diagnose real scan chain defects
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Diagnosis of defects on scan enable and clock trees
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Isolation of Failing Scan Cells through Convolutional Test Response Compaction
Journal of Electronic Testing: Theory and Applications
Dynamic learning based scan chain diagnosis
Proceedings of the conference on Design, automation and test in Europe
Diagnosis, modeling and tolerance of scan chain hold-time violations
Proceedings of the conference on Design, automation and test in Europe
A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Scan chain hold-time violations: can they be tolerated
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnosis of single stuck-at faults and multiple timing faults in scan chains
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs
Journal of Electronic Testing: Theory and Applications
An ATE assisted DFD technique for volume diagnosis of scan chains
Proceedings of the 50th Annual Design Automation Conference
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