Implementation of Concurrent Checking Circuits by Independent Sub-circuits

Authors:
Vladimir Ostrovsky;Ilya Levin
Affiliations:
Bar-Ilan University, Ramat Gan;Bar-Ilan University, Ramat Gan
Venue:
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Year:
2005

Citing 0
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One-to-Many: Context-Oriented Code for Concurrent Error Detection

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Abstract

The present paper proposes a new method for detecting arbitrary faults in a functional circuit when the set of codewords is limited and known in advance. The method is based on implementation of the functional circuit by a plurality of separate independent sub-circuits. Each of such sub-circuits generates its own subset of output signals. Since the sub-circuits do not have common elements, any single fault may result in errors only in one of the subsets. The paper presents a solution of the problem of optimal partition of the set of output variables into independent subsets. A number of properties of partitions are proven. The proposed algorithms of the optimal partition are based on these properties. A scheme of the checker for the proposed self-checking approach is presented. Benchmarks驴 results indicate efficiency of the described technique.