Recovery During Concurrent On-Line Testing of Identical Circuits

  • Authors:

  • Irith Pomeranz;Sudhakar M. Reddy

  • Affiliations:

  • Purdue University;University of Iowa

  • Venue:
  • DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
  • Year:
  • 2005

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Abstract

We show that a concurrent on-line testing scheme based on output comparison of identical circuits can also identify situations where the circuit recovers from a permanent fault, i.e., functional operation can continue temporarily in spite of the presence of a fault. We show that the ability to recover from a fault is circuit-dependent, and that some circuits are better than others at allowing recovery. We also discuss the possibility of false recovery in the presence of multiple faults and its implications.