CryptoScan: A Secured Scan Chain Architecture

Authors:
D. Mukhopadhyay;S. Banerjee;D. RoyChowdhury;B. B. Bhattacharya
Affiliations:
Indian Institute of Technology Kharagpur, India;Indian Institute of Technology Kharagpur, India;Indian Institute of Technology Kharagpur, India;Indian Institute of Technology Kharagpur, India
Venue:
ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
Year:
2005

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Abstract

Scan based testing is a powerful and popular test technique. However the scan chain can be used by an attacker to decipher the cryptogram. The present paper shows such a side-channel attack on LFSR-based stream ciphers using scan chains. The paper subsequently discusses a strategy to build the scan chains in a tree based pattern with a selfchecking compactor. It has been shown that such a structure prevents such scan based attacks but does not compromise on fault coverage.