Z-DFD: DESIGN-FOR-DIAGNOSABILITY BASED ON THE CONCEPT OF Z-DETECTION

  • Authors:
  • Irith Pomeranz;Srikanth Venkataraman;Sudhakar M. Reddy

  • Affiliations:
  • Purdue University, W. Lafayette, IN;Intel Corporation, Hillsboro, OR;University of Iowa, Iowa City, IA

  • Venue:
  • ITC '04 Proceedings of the International Test Conference on International Test Conference
  • Year:
  • 2004

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Abstract

We address the problem of design-for-diagnosability, i.e., improving the accuracy of fault diagnosis or reducing its complexity through the insertion of observation points. To perform design-for-diagnosability efficiently, we use a procedure developed earlier for computing the number of fault pairs, NP , that are not guaranteed to be distinguished by a given test set. By using the concept of z - detection, NP can be computed efficiently without enumerating fault pairs and without performing non-fault dropping fault simulation. We study the possibility of increasing the diagnosability of a circuit by inserting observation points so as to reduce NP . Our results include the following. (1) We find experimentally the number of observation points that need to be inserted in order to achieve a close-to-minimum value for NP . (2) We describe an efficient procedure for inserting a given number of observation points so as to reduce NP. We present experimental results for benchmark circuits to demonstrate the accuracy of using NP to guide a designfor- diagnosability process.