A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories

Authors:
Robert C. Aitken
Affiliations:
Artisan Components, Caspian Court Sunnyvale, CA, USA
Venue:
ITC '04 Proceedings of the International Test Conference on International Test Conference
Year:
2004

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Abstract

This paper describes a modular design of a wrapper enabling BIST/BISR for small memories operating as register files or FIFOs in high speed applications such as graphics and networking. The wrapper allows for atspeed test at low overhead and enables a simple repair scheme when millions of bits are used in such memories. The wrapper is intended to provide a standardized interface between memory and test controller, and thus work with any BIST controller, and communication between the two is minimized and at a reduced frequency.