A Bibliography on Digital and Computational Convexity (1961-1988)
IEEE Transactions on Pattern Analysis and Machine Intelligence
Geometric Precision in Noise-Free Digital Images
IEEE Transactions on Pattern Analysis and Machine Intelligence
The Topology of Locales and Its Effects on Position Uncertainty
IEEE Transactions on Pattern Analysis and Machine Intelligence
The Geometry of Basis Sets for Morphologic Closing
IEEE Transactions on Pattern Analysis and Machine Intelligence
The Specification of Edge Penalties for Regular and Irregular Pixel Images
IEEE Transactions on Pattern Analysis and Machine Intelligence
On Recursive, O(N) Partitioning of a Digitized Curve into Digital Straight Segments
IEEE Transactions on Pattern Analysis and Machine Intelligence
Digitized Circular Arcs: Characterization and Parameter Estimation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Fast, accurate and convergent tangent estimation on digital contours
Image and Vision Computing
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This paper considers the problem of measuring properties of digitized straight lines from the viewpoint of measurement methodology. The measurement and estimation process is described in detail, revealing the importance of a step called ``characterization'' which was not recognized explicitly before. Using this new concept, BLUE (Best Linear Unbiased) estimators are found. These are calculated for various properties of digitized straight lines, and are briefly compared to previous work.