Best Linear Unbiased Estimators for Properties of Digitized Straight Lines
IEEE Transactions on Pattern Analysis and Machine Intelligence
Algorithms for subpixel registration
Computer Vision, Graphics, and Image Processing
On the Number of Digital Straight Line Segments
IEEE Transactions on Pattern Analysis and Machine Intelligence
Geometric Precision in Noise-Free Digital Images
IEEE Transactions on Pattern Analysis and Machine Intelligence
Predicting and Estimating the Accuracy of a Subpixel Registration Algorithm
IEEE Transactions on Pattern Analysis and Machine Intelligence
Subpixel Precision of Straight-Edged Shapes for Registration and Measurement
IEEE Transactions on Pattern Analysis and Machine Intelligence
Spatial Sampling of Printed Patterns
IEEE Transactions on Pattern Analysis and Machine Intelligence
Twenty Years of Document Image Analysis in PAMI
IEEE Transactions on Pattern Analysis and Machine Intelligence
Digital Geometry for Image-Based Metrology
DGCI '02 Proceedings of the 10th International Conference on Discrete Geometry for Computer Imagery
Modeling context as statistical dependence
CONTEXT'05 Proceedings of the 5th international conference on Modeling and Using Context
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The precision to which the position of a target in a digital image can be estimated may be analyzed by considering the possible digital representations of the target. Such an analysis leads to regions of indistinguishable target position, referred to as locales. By considering the density, distribution, and shape of these locales, the available precision can be estimated. Previously, such analyses have presumed an absence of noise in the digital image. It is shown how the noise tolerance for position estimation is affected by the topological properties of locales, such as locale connectivity, adjacency, and clustering.