A digital calibration algorithm for implementing accurate on-chip resistors

  • Authors:
  • Ayman A. Fayed;M. Ismail

  • Affiliations:
  • Texas Instruments Inc., Dallas, USA 75243;Analog VLSI Laboratory, Department of Electrical Engineering, The Ohio State University, Columbus, USA 43210

  • Venue:
  • Analog Integrated Circuits and Signal Processing
  • Year:
  • 2006

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Abstract

A digital calibration algorithm that provides a systematic method for implementing accurate integrated resistors without compromising linearity or noise performance is described. The technique uses a single external resistor as a reference to implement multiple, different valued integrated resistors without requiring any accurate reference voltage. The algorithm provides a method to calibrate several on-chip resistors without replicating the calibration circuit, and it can achieve an arbitrary accuracy limited only by the external resistor's accuracy and mismatch errors. Terminations for two high speed wire line transceivers are implemented using the algorithm and simulations and measurements results show adequate performance across process, temperature, and supply voltage.