Test Control for Secure Scan Designs
ETS '05 Proceedings of the 10th IEEE European Symposium on Test
Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard
ITC '04 Proceedings of the International Test Conference on International Test Conference
Scan Based Side Channel Attacks on Stream Ciphers and Their Counter-Measures
INDOCRYPT '08 Proceedings of the 9th International Conference on Cryptology in India: Progress in Cryptology
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It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presented in the literature in order to securize the scan chain. Nevertheless, the different proposed techniques are all ad hoc techniques, which are not always easy to integrate into a completely automated design flow or in an IP reuse environment. In this paper, we propose a scan chain integrity detection mechanism, which respects both automated design flow and IP reuse environment.