Evaluating Sigma-Delta Modulated Signals to Develop Fault-Tolerant Circuits

Authors:
Erik Schuler;Daniel Scain Farenzena;Luigi Carro
Affiliations:
Universidade Federal do Rio Grande do Sul, Brazil;Universidade Federal do Rio Grande do Sul, Brazil;Universidade Federal do Rio Grande do Sul, Brazil
Venue:
ETS '06 Proceedings of the Eleventh IEEE European Test Symposium
Year:
2006

Citing 0
Cited 2

Functionally Fault-tolerant DSP Microprocessor using Sigma---delta Modulated Signals

Journal of Electronic Testing: Theory and Applications
Fault Tolerance Analysis of Communication System Interleavers: the 802.11a Case Study

Journal of Signal Processing Systems

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Abstract

As microelectronics evolves smaller into the nanometric scale, external interferences starts to be harmful to the system expected behavior. As classical systems do not handle adequately faults caused by such sources, new topologies are proposed. Our present work proposes a solution for this problem consisting on the use of sigma-delta modulation in order to obtain a faulttolerance even in presence of multiple faults. This paper provides the mathematical analysis and demonstration to support the proposed approach.