Evaluation of analog/RF test measurements at the design stage
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Post-deployment trust evaluation in wireless cryptographic ICs
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Testing RF circuits with true non-intrusive built-in sensors
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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Most scan based designs implement the scan enable as a slow speed global control signal, and can therefore only implement launch-on-capture (LOC) delay tests. Launch-onshift (LOS) tests are generally more effective, achieving higher fault coverage with ...