Using patterns in the automatic marking of ER-diagrams

Authors:
Pete Thomas;Kevin Waugh;Neil Smith
Affiliations:
Open University, Milton Keynes, UK;Open University, Milton Keynes, UK;Open University, Milton Keynes, UK
Venue:
Proceedings of the 11th annual SIGCSE conference on Innovation and technology in computer science education
Year:
2006

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Abstract

This paper illustrates how the notion of pattern can be used in the automatic analysis and synthesis of diagrams, applied particularly to the automatic marking of ER-diagrams. The paper describes how diagram patterns fit into a general framework for diagram interpretation and provides examples of how patterns can be exploited in other fields. Diagram patterns are defined and specified within the area of ER-diagrams. The paper also shows how patterns are being exploited in a revision tool for understanding ER-diagrams.