FO[\le]-Uniformity

Authors:
Christoph Behl;Klaus-Jorn Lange
Affiliations:
Universitat Tubingen, Germany;Universitat Tubingen, Germany
Venue:
CCC '06 Proceedings of the 21st Annual IEEE Conference on Computational Complexity
Year:
2006

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Theoretical Computer Science

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Abstract

Uniformity notions more restrictive than the usual FO[\le,+, ]-uniformity = FO[\le,Bit]-uniformity are introduced. It is shown that the general framework exhibited by Barrington et al. still holds if the fan-in of the gates in the corresponding circuits is considered.