On the corrupting influence of variability in semiconductor manufacturing
Proceedings of the 31st conference on Winter simulation: Simulation---a bridge to the future - Volume 1
Input modeling: input modeling techniques for discrete-event simulations
Proceedings of the 33nd conference on Winter simulation
A detailed model for a high-mix low-volume asic fab
Proceedings of the Winter Simulation Conference
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In this research, we investigate how well Weibull, Gamma, and special bimodal distribution are suited as an alternative to the exponential distribution approach in the stochastic modeling of machine downtimes and times between failures. We also discuss the question whether sampling shop-floor data should not only include first order statistics, but also measures that allow to monitor and model the variability of the equipment and processes and even the correct distribution of the data.