On the corrupting influence of variability in semiconductor manufacturing

  • Authors:
  • Alexander K. Schoemig

  • Affiliations:
  • Infineon Technologies AG, Operational Excellence, P.O. Box 10 09 44, D-93009 Regensburg, Germany

  • Venue:
  • Proceedings of the 31st conference on Winter simulation: Simulation---a bridge to the future - Volume 1
  • Year:
  • 1999

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Abstract