Error Tolerance of DNA Self-Assembly by Monomer Concentration Control

Authors:
Byunghyun Jang;Yong-Bin Kim;Fabrizio Lombardi
Affiliations:
Northeastern University, USA;Northeastern University, USA;Northeastern University, USA
Venue:
DFT '06 Proceedings of the 21st IEEE International Symposium on on Defect and Fault-Tolerance in VLSI Systems
Year:
2006

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Abstract

This paper proposes the control of monomer concentration as a novel improvement of the kinetic Tile Assembly Model (kTAM) to reduce the error rate in DNA self-assembly. Tolerance to errors in this process is very important for manufacturing highly dense ICs; the proposed technique significantly decreases error rates (i.e. it increases error tolerance) by controlling the concentration of monomers. A stochastic analysis based on a new state model is presented. Error rates reductions of at least 10% are found by evaluating the proposed scheme comparing to a scheme with constant concentration. One of the significant advantages of the proposed scheme is that it doesn't entail an overhead such as increase in size and a slow growth, while still achieving a significant reduction in error rate.