Reliability Analysis of Self-Repairable MEMS Accelerometer

Authors:
Xingguo Xiong;Yu-Liang Wu;Wen-Ben Jone
Affiliations:
University of Bridgeport, USA;The Chinese University of Hong Kong, Hong Kong;University of Cincinnati, USA
Venue:
DFT '06 Proceedings of the 21st IEEE International Symposium on on Defect and Fault-Tolerance in VLSI Systems
Year:
2006

Citing 0
Cited 2

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability
Built-in self-detection/correction architecture for motion estimation computing arrays

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Quantified Score

Hi-index	0.00

Visualization

Abstract

This paper presents simulations of 3 different implementations of the minority-3 function, with special focus on mismatch analysis through statistical Monte Carlo-simulations. The simulations clearly favors the minority-3 Mirrored gate, and a gate-level ...