Trend and Challenge on System-on-a-Chip Designs
Journal of Signal Processing Systems
Process variability-aware transient fault modeling and analysis
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Formal modeling and reasoning for reliability analysis
Proceedings of the 47th Design Automation Conference
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Variability and reliability will be the barriers to future technology scaling. Every discipline, from fabrication to software, needs to cooperate and make the VLSI system reliable in the presence of variability and the resulting inherent unreliability of components.