SUSAN—A New Approach to Low Level Image Processing
International Journal of Computer Vision
Geometric Camera Calibration Using Circular Control Points
IEEE Transactions on Pattern Analysis and Machine Intelligence
Unsupervised Learning of Finite Mixture Models
IEEE Transactions on Pattern Analysis and Machine Intelligence
Video Processing and Communications
Video Processing and Communications
The Document Spectrum for Page Layout Analysis
IEEE Transactions on Pattern Analysis and Machine Intelligence
IEEE Transactions on Pattern Analysis and Machine Intelligence
Towards Automatic Analysis of DNA Microarrays
WACV '02 Proceedings of the Sixth IEEE Workshop on Applications of Computer Vision
Robust DNA microarray image analysis
Machine Vision and Applications
A survey of table recognition: Models, observations, transformations, and inferences
International Journal on Document Analysis and Recognition
Gridline: automatic grid alignment DNA microarray scans
IEEE Transactions on Image Processing
Sub-grid detection in DNA microarray images
PSIVT'07 Proceedings of the 2nd Pacific Rim conference on Advances in image and video technology
Sub-grid and spot detection in DNA microarray images using optimal multi-level thresholding
PRIB'10 Proceedings of the 5th IAPR international conference on Pattern recognition in bioinformatics
Biological assessment of grid and spot detection in cDNA microarray images
Proceedings of the 2nd ACM Conference on Bioinformatics, Computational Biology and Biomedicine
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In this paper, properties of planar (2D) grids are addressed in a mathematical point of view, and a novel algorithm for recognizing distorted grids with perspective transformations is presented. The proposed approach contains three parts: (a) recognizing parameters of affinely distorted grids by fitting Gaussian mixture models (GMMs) to grid spectrums, (b) rebuilding the grid structures via a generating iteration based on the acquired parameters, and (c) eliminating nonlinear effects caused by perspective transformations with the median of infinite lines from local structures (MILLS) method. All parts are precise and robust to local distortions, the absence of elements, and outliers. The accuracy and robustness are demonstrated by quantitative statistics in experiments on synthesis grids and real grid images.