Extended Hough transform for linear feature detection

  • Authors:
  • J. Cha;R. H. Cofer;S. P. Kozaitis

  • Affiliations:
  • Department of Computer Sciences, Florida Institute of Technology, 150 West University Boulevard, Melbourne, FL 32901, USA;Department of Electrical and Computer Engineering, Florida Institute of Technology, 150 West University Boulevard, Melbourne, FL 32901, USA;Department of Electrical and Computer Engineering, Florida Institute of Technology, 150 West University Boulevard, Melbourne, FL 32901, USA

  • Venue:
  • Pattern Recognition
  • Year:
  • 2006

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Abstract

Improving the accuracy of line segment detection reduces the complexity of subsequent high-level processing common in cartographic feature detection. We developed a new extension to the Hough transform and reported on its application to building extraction. We expanded the Hough space by a third parameter, the horizontal or vertical coordinate of the image space, to provide incremental information as to the length of the lineal feature being sought. Using this extended HT transform allowed us to more accurately detect the true length of a line segment. In addition, we used a Bayesian probabilistic approach to process our extended Hough space that further increased the accuracy of our extended Hough transform.