Detecting fingerprint minutiae by run length encoding scheme

Authors:
Jung-Hwan Shin;Hui-Yeoun Hwang;Sung-Il Chien
Affiliations:
School of Electronic and Electrical Engineering, Kyungpook National University, Daegu 702-701, South Korea;Samsung Electronics, Co., Ltd., Suwon 442-742, South Korea;School of Electronic and Electrical Engineering, Kyungpook National University, Daegu 702-701, South Korea
Venue:
Pattern Recognition
Year:
2006

Citing 19
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Abstract

Many approaches to minutiae extraction have already been proposed for automatic fingerprint matching, and most transform fingerprint images into binary images through state-of-the-art algorithms and submit the binary image to a thinning process. However, this paper proposes an original technique for extracting minutiae based on representing the ridge structure of a fingerprint image as a run length code (RLC). The essential idea is to detect minutiae by searching for the termination points or bifurcation points of ridges in the RLC, rather than in a fingerprint image. Experimental results and a comparative analysis show that the proposed method is fairly reliable and faster than a conventional thinning-based method.