Faster two-dimensional pattern matching with rotations

Authors:
Amihood Amir;Oren Kapah;Dekel Tsur
Affiliations:
Department of Computer Science, Bar-Ilan University, 52900 Ramat-Gan, Israel and Georgia Tech;Department of Computer Science, Bar-Ilan University, 52900 Ramat-Gan, Israel;Department of Computer Science, Ben-Gurion University of the Negev. Be'er Sheva 84105, Israel
Venue:
Theoretical Computer Science
Year:
2006

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Abstract

The most efficient currently known algorithms for two-dimensional pattern matching with rotations have a worst case time complexity of O(n^2m^3), where the size of the text is nxn and the size of the pattern is mxm. In this paper we present a new algorithm for the problem whose running time is O(n^2m^2).