An automatic parameter extraction technique for advanced CMOS device modeling using genetic algorithm

Authors:
Yiming Li
Affiliations:
Department of Communication Engineering, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 300, Taiwan
Venue:
Microelectronic Engineering
Year:
2007

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Abstract

This paper presents a unique scheme for testing and locating multiple stuck at faults in the embedded RAM modules of SRAM-based FPGAs. The RAM modules are tested using the MATS++ algorithm. The interconnection scheme makes it possible to test all the ...