Software reliability modeling survey
Handbook of software reliability engineering
A Critique of Software Defect Prediction Models
IEEE Transactions on Software Engineering
A case study in root cause defect analysis
Proceedings of the 22nd international conference on Software engineering
Software project management in practice
Software project management in practice
Metrics and Models in Software Quality Engineering
Metrics and Models in Software Quality Engineering
Software defect-removal efficiency
Computer
Industrial-Strength Management Strategies
IEEE Software
Learning from Our Mistakes with Defect Causal Analysis
IEEE Software
Static analysis tools as early indicators of pre-release defect density
Proceedings of the 27th international conference on Software engineering
Predicting the Location and Number of Faults in Large Software Systems
IEEE Transactions on Software Engineering
Software Reliability Models: Assumptions, Limitations, and Applicability
IEEE Transactions on Software Engineering
Software Reliability Growth Modeling: Models and Applications
IEEE Transactions on Software Engineering
CBSE'06 Proceedings of the 9th international conference on Component-Based Software Engineering
Who tested my software? Testing as an organizationally cross-cutting activity
Software Quality Control
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Most large software products have elaborate quality control processes involving many tasks performed by different groups using a variety of techniques. The defects found are generally recorded in a database which is used for tracking and prioritizing defects. However, this defect data also provides a wealth of information which can be analyzed for improving the process. In this paper, we describe the when-who-how approach for analyzing defect data to gain a better understanding of the quality control process and identify improvement opportunities. At the component level, the analysis provides the capability to assess strength of dependency between components, and new ways to study correlation between early and late defects. We also discuss the experience of applying this approach to defect data from an earlier version of Windows, and the improvement opportunities it revealed.