Electronic test solutions for FlowFET fluidic arrays

  • Authors:

  • H. G. Kerkhoff;M. Acar

  • Affiliations:

  • Testable Design & Test of Microsyst. Group, MESA Res. Inst., Enschede, Netherlands;Testable Design & Test of Microsyst. Group, MESA Res. Inst., Enschede, Netherlands

  • Venue:
  • DTIP '03 Proceedings of the Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
  • Year:
  • 2003

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Abstract

The testable design and test of a software-controllable lab-on-a-chip, including a fluidic array of FlowFETs, control and interface electronics is presented. Test hardware is included for detecting faults in the DMOS electro-fluidic interface and the digital parts. Multi-domain fault modelling and simulation shows the effects of faults in the (combined) fluidic and electrical parts. Fault simulations also reveal important parameters of multi-domain test-stimuli for detecting both electrical and fluidic defects.