Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios

Authors:
V. Natarajan;G. Srinivasan;A. Chatterjee;Craig Force
Affiliations:
Georgia Tech, USA;Georgia Tech, USA;Georgia Tech, USA;Texas Instruments, USA
Venue:
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Year:
2007

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Low cost MIMO testing for RF integrated circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

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Abstract

Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ...