Low cost MIMO testing for RF integrated circuits

Authors:
Erkan Acar;Sule Ozev
Affiliations:
Intel Corporation, Hillsboro, OR and Department of Electrical and Computer Engineering, Duke University, Durham NC;Department of Electrical and Engineering, Arizona State University, Tempe, AZ
Venue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year:
2010

Citing 5
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Abstract

Multiple-input-multiple-output (MIMO)-based systems are extremely popular as they offer data rates as twice as fast as currently available systems. Their testing becomes more complicated due to the increased number of RF paths. This increases the overall test cost of these devices both in terms of test time and instrumentation cost. In this paper, we demonstrate a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, IIP3, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of these performance parameters. Using the proposed test method, RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry within a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.