Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
At-Speed Interconnect Test and Diagnosis of External Memories on a System
ITC '04 Proceedings of the International Test Conference on International Test Conference
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Economic testing of small devices like LCD drivers is a real challenge. In this paper we describe an approach where a production tester is extended by a memory test engine (MTE). This MTE, which consists of hardware and software components allows testing the LCD driver memory at speed, allowing at the same time the concurrent execution of other tests. It is fully integrated into the tester. The MTE leads to a significant increase of memory test quality and at the same time to a significant reduction of the test time. The test time reduction that was achieved by executing the memory test in parallel to other analog tests lead to the test cost reduction, which was the impetus for developing the MTE.