Design of high-resolution MOSFET-only pipelined ADCs with digital calibration

Authors:
Hamed Aminzadeh;Mohammad Danaie;Reza Lotfi
Affiliations:
Ferdowsi University of Mashhad, Mashhad, Iran;Ferdowsi University of Mashhad, Mashhad, Iran;Ferdowsi University of Mashhad, Mashhad, Iran
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2007

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Abstract

Design of low-voltage high-resolution MOSFET-only pipeline analog to digital converters (ADCs) has been investigated in this work. The nonlinearity caused by replacing linear MIM capacitors with compensated depletion-mode MOS transistors in all 1.5-bit residue stages of the ADC has been properly modeled to be calibrated in digital domain. The proposed calibration technique makes it possible to digitally compensate the nonlinearity of a 1.8V 12-bit 65MS/s MOSFET-only ADC in 0.18μm standard digital CMOS technology. It improves the values of signal-to-noise-plus-distortion-ratio (SNDR) and spurious-free dynamic range (SFDR) by approximately 27dB and 35dB respectively.