A study of interleaving coverage criteria

Authors:
Shan Lu;Weihang Jiang;Yuanyuan Zhou
Affiliations:
University of Illinois at Urbana Champaign, Urbana, IL;University of Illinois at Urbana Champaign, Urbana, IL;University of Illinois at Urbana Champaign, Urbana, IL
Venue:
The 6th Joint Meeting on European software engineering conference and the ACM SIGSOFT symposium on the foundations of software engineering: companion papers
Year:
2007

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Abstract

Concurrency bugs are becoming increasingly important due to the prevalence of concurrent programs. A fundamental problem of concurrent program bug detection and testing is that the interleaving space is too large to be thoroughly explored. Practical yet effective interleaving coverage criteria are desired to systematically explore the interleaving space and effectively expose concurrency bugs. This paper proposes a concurrent program interleaving coverage criteria hierarchy, including seven (including five new) coverage criteria. These criteria are all designed based on different concurrency fault models. Their cost ranges from exponential to linear.