All-du-path coverage for parallel programs

  • Authors:

  • Cheer-Sun D. Yang;Amie L. Souter;Lori L. Pollock

  • Affiliations:

  • Department of Computer and Information Sciences, University of Delaware, Newark, DE;Department of Computer and Information Sciences, University of Delaware, Newark, DE;Department of Computer and Information Sciences, University of Delaware, Newark, DE

  • Venue:
  • Proceedings of the 1998 ACM SIGSOFT international symposium on Software testing and analysis
  • Year:
  • 1998

Quantified Score

Hi-index 0.00

Visualization

Abstract

One significant challenge in bringing the power of parallel machines to application programmers is providing them with a suite of software tools similar to the tools that sequential programmers currently utilize. In particular, automatic or semi-automatic testing tools for parallel programs are lacking. This paper describes our work in automatic generation of all-du-paths for testing parallel programs. Our goal is to demonstrate that, with some extension, sequential test data adequacy criteria are still applicable to parallel program testing. The concepts and algorithms in this paper have been incorporated as the foundation of our DELaware PArallel Software Testing Aid, della pasta.