Chip placement in a reticle for multiple-project wafer fabrication

  • Authors:
  • Meng-Chiou Wu;Rung-Bin Lin;Shih-Cheng Tsai

  • Affiliations:
  • Yuan Ze University, Chung-Li, Taiwan;Yuan Ze University, Chung-Li, Taiwan;Yuan Ze University, Chung-Li, Taiwan

  • Venue:
  • ACM Transactions on Design Automation of Electronic Systems (TODAES)
  • Year:
  • 2008

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Abstract

Chip placement in a reticle is crucial to the cost of a multiproject wafer run. In this article we develop several chip placement methods based on the volume-driven compatibility optimization (VOCO) concept, which maximizes dicing compatibility among chips with large-volume requirements while minimizing reticle dimensions. Our mixed-integer linear programming models with VOCO are too complex to render good solutions for large test cases. Our B*-tree with VOCO and HQ with VOCO use 16%∼ 29% fewer wafers and 8%∼ 19% less reticle area than the hierarchical quadrisection (HQ) method proposed by Kahng et al. [2005]