On the Construction of Small Fully Testable Circuits with Low Depth

Authors:
Gorschwin Fey;Anna Bernasconi;Valentina Ciriani;Rolf Drechsler
Affiliations:
University of Bremen;University of Pisa;University of Milano;University of Bremen
Venue:
DSD '07 Proceedings of the 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools
Year:
2007

Citing 0
Cited 2

Testability analysis based on the identification of testable blocks with predefined properties

Microprocessors & Microsystems
On the construction of small fully testable circuits with low depth

Microprocessors & Microsystems

Quantified Score

Hi-index	0.00

Visualization

Abstract

Electrical engineers have learned how to build amazingly complex systems by assembling transistors, wires, and passive components into intricate networks. While solidly founded in semiconductor physics, pure engineering has made possible the design of ...