SWiTEST: a switch level test generation system for CMOS combinational circuits

• Authors:

• K. J. Lee;C. A. Njinda;M. A. Breuer

• Affiliations:

• Dept. of Electrical Engineering, National Cheng-Kung University, Tainan 70101, Taiwan, R.O.C.;Dept. of EE-Systems, University of Southern California, Los Angeles, CA;Dept. of EE-Systems, University of Southern California, Los Angeles, CA

• Venue:
• DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
• Year:
• 1992