Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
Minimal Fault Tests for Redundant Combinational Networks
IEEE Transactions on Computers
LSI logic testing: an overview
IEEE Transactions on Computers
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It is shown that the definition of check points of combinational networks given earlier1 must be expanded to include the primary input nodes which fan out (in addition to the fan out branches from these nodes) in order to make the derivation of test sets for detecting single stuck-at faults1valid.