A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Multi-chip module test and diagnostic methodology
IBM Journal of Research and Development
Failure diagnosis on the LT1280
IBM Journal of Research and Development
Hi-index | 14.98 |
This paper describes a new type of shift register latch that is compatible with LSSD. The new latch has the property that information may be shifted in and out of it in two directions: left to right and right to left.