On Necessary and Sufficient Conditions for Multiple Fault Undetectability

Authors:
J. E. Smith
Affiliations:
University of Wisconsin-Madison
Venue:
IEEE Transactions on Computers
Year:
1979

Citing 0
Cited 2

The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's

IEEE Transactions on Computers
Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis

IEEE Transactions on Computers

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Abstract

This correspondence states necessary and sufficient conditions for a multiple stuck-at fault in a combinational network to be undetected by a test set. The conditions are given in terms of fault masking relationships. It is shown that several other statements on this subject which have appeared in the literature are invalid.