Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
Generic Fault Characterizations for Table Look-Up Coverage Bounding
IEEE Transactions on Computers
Fault Masking in Combinational Logic Circuits
IEEE Transactions on Computers
A Design for Testability of Undetectable Crosspoint Faults in Programmable Logic Arrays
IEEE Transactions on Computers
Multiple Fault Detection in Programmable Logic Arrays
IEEE Transactions on Computers
Minimal Fault Tests for Combinational Networks
IEEE Transactions on Computers
Fault Analysis and Test Generation for Programmable Logic Arrays (PLA's)
IEEE Transactions on Computers
On Necessary and Sufficient Conditions for Multiple Fault Undetectability
IEEE Transactions on Computers
Detection of Faults in Programmable Logic Arrays
IEEE Transactions on Computers
Multiple Fault Testing of Large Circuits by Single Fault Test Sets
IEEE Transactions on Computers
An introduction to array logic
IBM Journal of Research and Development
An algorithmic branch and bound method for PLA test pattern generation
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
| Hi-index | 14.98 |
It is relatively easy to generate a complete single contact fault detection test set Tc for a PLA. However such a test set may fail to detect all multiple faults due to the phenomenon of masking. In previous papers attempting to quantitatively predict the multiple fault coverage capability of a single fault detection test set Tc in PLA's, it was proved that every multiple contact fault in an irredundant PLA is detected by Tc if the multiple fault does not contain any four-way masking cycle. In this correspondence, the masking relations are studied in detail and it is shown that Tc in fact detects a signifilcant percentage of faults with four-way masking. Based on these results more realistic bounds of the coverage capability of Tc are determined. It is shown that the multiple fault coverage ratio of Tc increases with the increasing number m of rows of a PLA and for m = 24 Tc detects 99 percent of all contact faults of size 8 or less.