The Fanout Structure of Switching Functions
Journal of the ACM (JACM)
Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
The Boolean Difference and Multiple Fault Analysis
IEEE Transactions on Computers
Generic Fault Characterizations for Table Look-Up Coverage Bounding
IEEE Transactions on Computers
Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
An introduction to array logic
IBM Journal of Research and Development
A New Approach to the Design of Testable PLA's
IEEE Transactions on Computers
ISMIS '00 Proceedings of the 12th International Symposium on Foundations of Intelligent Systems
The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's
IEEE Transactions on Computers
A Design for Testability of Undetectable Crosspoint Faults in Programmable Logic Arrays
IEEE Transactions on Computers
An Easily Testable Design of Programmable Logic Arrays for Multiple Faults
IEEE Transactions on Computers
Online multiple error detection in crossbar nano-architectures
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
On multiple fault coverage and aliasing probability measures
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
A New PLA Design for Universal Testability
IEEE Transactions on Computers
Online detection of multiple faults in crossbar nano-architectures using dual rail implementations
NANOARCH '09 Proceedings of the 2009 IEEE/ACM International Symposium on Nanoscale Architectures
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The increasing recognition of PLA's as efficient and viable modules for such purposes as microprogramming and design of sequential controllers has led to a growing interest in the development of optimum fault detection test sets for these modules. It is now well known that a fault type which is unique to PLA's is the class of contact faults. A single contact fault is the spurious presence or absence of a contact between a row and a column of a PLA. We consider in this paper the problem of determining the capability of complete single contact fault test sets to cover multiple contact faults of PLA's. Our approach consists of developing a model of PLA's which allows one to represent a contact fault in a PLA as a stuck-at fault in the model of the PLA. Using this model, it is shown that more than 98 percent of all multiple contact faults of size 8 and less are inherently covered by every complete single contact fault test set in a PLA. Applications of this model to stuck-at fault diagnosis are also discussed.