On multiple fault coverage and aliasing probability measures

Authors:
Henry Cox;André Ivanov;Vinod K. Agarwal;Janusz Rajski
Affiliations:
Department of Electrical Engineering, McGill University, Montréal, Canada;Department of Electrical Engineering, McGill University, Montréal, Canada;Department of Electrical Engineering, McGill University, Montréal, Canada;Department of Electrical Engineering, McGill University, Montréal, Canada
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

Citing 10
Cited 0

Built-in test for VLSI: pseudorandom techniques

Built-in test for VLSI: pseudorandom techniques
On computing optimized input probabilities for random tests

DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
Multiple fault diagnosis in combinational networks

DAC '79 Proceedings of the 16th Design Automation Conference
Syndrome-Testable Design of Combinational Circuits

IEEE Transactions on Computers
Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis

IEEE Transactions on Computers
Measures of the Effectiveness of Fault Signature Analysis

IEEE Transactions on Computers
Multiple Fault Detection in Programmable Logic Arrays

IEEE Transactions on Computers
Multiple Fault Testing of Large Circuits by Single Fault Test Sets

IEEE Transactions on Computers
Built-In Self-Test Techniques

IEEE Design & Test
A method of fault analysis for test generation and fault diagnosis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Quantified Score

Hi-index	0.00

Visualization

Abstract

The paper contains a comparative study of different methods of calculating multiple fault coverage and aliasing probability measures. The interpretation, accuracy, and applicability of the measures are discussed.