The Fanout Structure of Switching Functions
Journal of the ACM (JACM)
Enumeration of Fanout-Free Boolean Functions
Journal of the ACM (JACM)
Logic Design of Digital Systems
Logic Design of Digital Systems
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Multiple fault diagnosis in combinational networks.
Multiple fault diagnosis in combinational networks.
Generic characterizations of multiple faults for table-look-up coverage bounding in tree networks.
Generic characterizations of multiple faults for table-look-up coverage bounding in tree networks.
Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
A Functional Form Approach to Test Set Coverage in Tree Networks
IEEE Transactions on Computers
The Boolean Difference and Multiple Fault Analysis
IEEE Transactions on Computers
Fault Detection in Fanout-Free Combinational Networks
IEEE Transactions on Computers
Recursive Coverage Projection of Test Sets
IEEE Transactions on Computers
On the Design of Multiple Fault Diagnosable Networks
IEEE Transactions on Computers
Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
Fault Equivalence in Combinational Logic Networks
IEEE Transactions on Computers
A Nand Model ror Fault Diagnosis in Combinational Logic Networks
IEEE Transactions on Computers
A New Representation for Faults in Combinational Digital Circuits
IEEE Transactions on Computers
The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's
IEEE Transactions on Computers
Multiple Fault Detection in Programmable Logic Arrays
IEEE Transactions on Computers
Multiple Fault Testing of Large Circuits by Single Fault Test Sets
IEEE Transactions on Computers
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Given any combinational, internal fan-out-free network and any complete single fault detection test set (SFDTS) for the network, we consider in this paper the problem of determining the minimal extent to which that SFDTS will cover multiple faults in the network. The basis of our approach is the development of a generic perspective to multiple faults which uses a representation of such faults called an L-expression. This perspective leads to a technique for obtaining the greatest lower bound on the multiple fault coverage capability of an SFDTS by means of a simple table look-up process. In addition to generalizing previously known results regarding multiple fault coverage, two particularly interesting results obtained from this approach are as follows: 1) On the average, every SFDTS for an internal fan-out-free network covers 92 percent of all multiple faults of sizes 8 and less. 2) On the average, every SFDTS for an internal fan-out-free network covers at least 46.1 percent of all multiple faults.