An algorithmic branch and bound method for PLA test pattern generation

Authors:
Markus Robinson;Janusz Rajski
Affiliations:
Department of Elactrical Engineering, McGill University, Montréal, Canada;Department of Elactrical Engineering, McGill University, Montréal, Canada
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

Citing 6
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Abstract

A method for PLA test, pattern generation based on a branch and bound algorithm that exploits function monotonicity is presented. The algorithm makes irrevocable input assignments first, resulting in the efficient generation of compact test sets. In most cases there is no backtracking. An intelligent branchin heuristic is presented. The algorithm handles extended fault models including crosspoint and delay faults. Heuristics which speed up test set genration and improve test set compaction are discussed. Results of tests on a wide range of benchmark PLAs are included.