Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
Fault Equivalence in Combinational Logic Networks
IEEE Transactions on Computers
A Nand Model ror Fault Diagnosis in Combinational Logic Networks
IEEE Transactions on Computers
Diagnosis of automata failures: a calculus and a method
IBM Journal of Research and Development
Design for Testability A Survey
IEEE Transactions on Computers
The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's
IEEE Transactions on Computers
Fault-Tolerant Computing: An Introduction and a Perspective
IEEE Transactions on Computers
Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis
IEEE Transactions on Computers
Truth-Table Verification of an Iterative Logic Array
IEEE Transactions on Computers
Resolution-Oriented Fault Interrelationships in Combinational Logic Networks
IEEE Transactions on Computers
On the Existence of Combinational Logic Circuits Exhibiting Multiple Redundancy
IEEE Transactions on Computers
LSI logic testing: an overview
IEEE Transactions on Computers
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An important problem in fault detection is to verify whether a single-fault test set is able to detect all multiple-faults. This paper provides a solution to the above problem. It is known that a test set derived for the detection of some fault may fail this purpose in the presence of an additional fault. This phenomenon is called masking among faults, and is of great importance in the derivation of a test set which detects all multiple-faults. This paper investigates the masking relations among faults in a combinational logic circuit. For this purpose a transform for the circuit is defined and a model for fault analysis is constructed. This transform and model reduce the number of faults which have to be considered in order to achieve the detection of all multiple-faults. An algebraic procedure yields the derivation of the masking relations. A problem which arises, namely the existence of a set of faults forming a loop of masking relations is considered. An application is presented: starting with a test set derived under the single-fault assumption it is shown how to extend this test set so that it detects all multiple-faults. All of the results in this paper are valid for general multiple-output circuits. For simplicity in the exposition, the single-output case is examined.