An algorithm for the generation of test sets for combinational logic networks.
An algorithm for the generation of test sets for combinational logic networks.
Multiple fault diagnosis in combinational networks.
Multiple fault diagnosis in combinational networks.
Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
The Boolean Difference and Multiple Fault Analysis
IEEE Transactions on Computers
Boolean Differential Calculus and its Application to Switching Theory
IEEE Transactions on Computers
Fault Masking in Combinational Logic Circuits
IEEE Transactions on Computers
Analyzing Errors with the Boolean Difference
IEEE Transactions on Computers
An Efficient Algorithm for Generating Complete Test Sets for Combinational Logic Circuits
IEEE Transactions on Computers
Fault Equivalence in Combinational Logic Networks
IEEE Transactions on Computers
A Nand Model ror Fault Diagnosis in Combinational Logic Networks
IEEE Transactions on Computers
Path Sensitization, Partial Boolean Difference, and Automated Fault Diagnosis
IEEE Transactions on Computers
Multiple Fault Testing of Large Circuits by Single Fault Test Sets
IEEE Transactions on Computers
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This correspondence considers fault resolution as a process of applying a sequence of input vectors, called tests, to a combinational logic network in order to resolve an existing fault situation from within a given master set of faults. A functional approach based upon an extension of the well-known Boolean difference concept to fault dependent situations is described. The test sets resulting from this extension, called fault dependent test sets, are fundamental to our considerations and are shown to be obtainable in a straightforward manner from standard test sets. Two fault interrelationships are defined which are particularly relevant to the resolution problem in that they algebraically describe the inherent limitations to the degree to which the existing fault situation can be resolved from within a given master set of faults using algebraic terminal experiments and fault dependent testing. Because these interrelationships are defined from a resolution-oriented point of view, they can be seen to be somewhat more intimate than other fault interrelationships which have been previously described in the literature. Some important ramifications of these interrelationships are discussed.