On the Properties of Irredundant Logic Networks
IEEE Transactions on Computers
Minimal Fault Tests for Redundant Combinational Networks
IEEE Transactions on Computers
Multiple Fault Testing of Large Circuits by Single Fault Test Sets
IEEE Transactions on Computers
On the Existence of Combinational Logic Circuits Exhibiting Multiple Redundancy
IEEE Transactions on Computers
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A simple, necessary and sufficient test is developed for testing whether a single connection in a tree-type NAND network is redundant. A procedure is presented for testing every connection in the network. The computational complexity of the procedure is mi2 where m = the number of gates and i = the average number of inputs per gate in the network.