Proceedings of the 16th Asia and South Pacific Design Automation Conference
Residue arithmetic for variation-tolerant design of multiply-add units
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
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For sub-9Onm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/SoC design yields significantly. This paper presents a recent silicon test chip experiment result which uses a set of innovative nanometer test structures and Monte-Carlo-based three-dimensional electromagnetic RC simulations to achieve silicon-correlated corner modeling of OCV that can be applied to the upcoming statistics-based timing analysis (SSTA) for design for manufacturability (DFM). Modeling and correlating OCV based on the randomly varying physical process parameters is therefore achieved for the realistic corner modeling of advanced copper and low-K.