A novel method for measuring semantic similarity for XML schema matching

Authors:
Buhwan Jeong;Daewon Lee;Hyunbo Cho;Jaewook Lee
Affiliations:
Department of Industrial and Management Engineering, Pohang University of Science and Technology (POSTECH), San 31, Hyoja-dong, Pohang 790-784, South Korea;Department of Industrial and Management Engineering, Pohang University of Science and Technology (POSTECH), San 31, Hyoja-dong, Pohang 790-784, South Korea;Department of Industrial and Management Engineering, Pohang University of Science and Technology (POSTECH), San 31, Hyoja-dong, Pohang 790-784, South Korea;Department of Industrial and Management Engineering, Pohang University of Science and Technology (POSTECH), San 31, Hyoja-dong, Pohang 790-784, South Korea
Venue:
Expert Systems with Applications: An International Journal
Year:
2008

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Abstract

Enterprises integration has recently gained great attentions, as never before. The paper deals with an essential activity enabling seamless enterprises integration, that is, a similarity-based schema matching. To this end, we present a supervised approach to measure semantic similarity between XML schema documents, and, more importantly, address a novel approach to augment reliably labeled training data from a given few labeled samples in a semi-supervised manner. Experimental results reveal the proposed method is very cost-efficient and reliably predicts semantic similarity.