Probabilistic Testability Analysis and DFT Methods at RTL

• Authors:

• J. M. Fernandes;M. B. Santos;A. L. Oliveira;J. C. Teixeira

• Affiliations:

• -;-;-;-

• Venue:
• DDECS '06 Proceedings of the 2006 IEEE Design and Diagnostics of Electronic Circuits and systems
• Year:
• 2006