INTEG: a stochastic testing system for microprocessor verification

Authors:
I. V. Gribkov;A. V. Zakharov;P. P. Koltsov;N. V. Kotovich;A. A. Kravchenko;A. S. Koutsaev;A. S. Osipov;I. S. Khisambeev
Affiliations:
Scientific Research Institute for System Studies, Russian Academy of Sciences (NIISI RAN), Moscow, Russia;Scientific Research Institute for System Studies, Russian Academy of Sciences (NIISI RAN), Moscow, Russia;Scientific Research Institute for System Studies, Russian Academy of Sciences (NIISI RAN), Moscow, Russia;Scientific Research Institute for System Studies, Russian Academy of Sciences (NIISI RAN), Moscow, Russia;Scientific Research Institute for System Studies, Russian Academy of Sciences (NIISI RAN), Moscow, Russia;Scientific Research Institute for System Studies, Russian Academy of Sciences (NIISI RAN), Moscow, Russia;Scientific Research Institute for System Studies, Russian Academy of Sciences (NIISI RAN), Moscow, Russia;Scientific Research Institute for System Studies, Russian Academy of Sciences (NIISI RAN), Moscow, Russia
Venue:
ICC'07 Proceedings of the 11th Conference on Proceedings of the 11th WSEAS International Conference on Circuits - Volume 11
Year:
2007

Citing 3
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Abstract

The primary goal of multijunction solar cell design is to maximize the output power for a given solar spectrum. The construction of multijunction cells places the individual junction layers in series, thereby limiting the overall output current to that ...